COURSE
DESCRIPTION
Instrumental
Analysis is a three-credit hour course covering both the theoretical and the
practical aspects of modern chemical instrumentation. The course is designed to expose students to
the wide variety of instrumentation and techniques available for chemical
analysis. The primary goal of the course
is to provide students with a thorough introduction to instrumental methods so
that they will be able to intelligently select and use the appropriate
techniques for a particular analysis.
Most important types of analytical
methods are covered, including atomic and molecular spectroscopy, mass
spectroscopy, chromatography, electrophoresis, electrochemistry and surface
analysis. Each instrumental method will be discussed in terms of instrument
design, sampling techniques, sensitivity, specificity, detection limits, and
other analytical strengths and weaknesses.
The student will learn how to select an appropriate method for a problem
and how to use the information available from the method. Special emphasis is placed on the
fundamentals of spectroscopy, chromatography and electrochemistry. Many advanced techniques will be discussed in
less detail but the student will be aware of how they are used. Instrument design, sample preparation methods,
precision, detection limits and sensitivity are examined for each
technique. Specific applications are
discussed for chemical, biochemical and environmental analyses.
PREREQUISITES
CHEM
321 and CHEM 321L are highly recommended
CHEM
322L should be taken concurrently
Computer skills are not a prerequisite but students who do
not know basic computer spreadsheet operations should see the instructor as
soon as possible to get special tutoring in these skills.
TEXT
J. R. Robinson, E. M. Skelly Frame, and G. M. Frame II,
Undergraduate Instrumental Analysis, 6th ed., Marcel Dekker (2005) ISBN
0-8247-5359-3. Most of chapters of the
text will be covered but not all at the same level of detail. See the list of
topics outlined below. Several handouts
that summarize important material will be provided in class.
CLASS HOURS
MWF 11:10 12:00
OFFICE HOURS
MWF 10:10-11:00, MW 3:10-4:00, R 1:10-2:00, F 12:10 1:00 or by appointment
Office
:
web
page:
http://WEBPAGES.SHEPHERD.EDU/DDILELLA/
ATTENDANCE POLICY
Students
are expected to attend all classes.
There are many topics covered in this course and, by necessity, many
will be covered at a lower level than is presented in the text. Class attendance is essential if a student
wants to know what is expected on a given topic.
ACADEMIC HONESTY
Cheating in all its forms, including plagiarism and
cheating on visual work, is considered an academic matter and will result in
automatic dismissal from the course and will be recorded on the official
transcript.
Tests
There
will be three term tests and a comprehensive final. There will be several in class quizzes and
graded take-home assignments. Makeup exams will not be administered without a
valid written excuse. Term exams that
are missed with a valid excuse may be made up during finals week.
Grading
Mid-term
tests (3) 50%
Take
Home Assignments and Quizzes 25%
Comprehensive
Final 25%
FINAL GRADE
The
final grade will be based on the following scale
A 89 %
to 100 %
B 77 %
to 88+ %
C 65 %
to 76+ %
D 50 %
to 64+ %
TOPICS AND ORDER OF PRESENTATION
For
some chapters not all sections will be covered.
For those chapters, the sections to be covered are given in parentheses
after the chapter title.
Chapter 1 (1.1
1.3, 1.5 1.6) Concepts of Instrumental Analysis
Qualitative
analysis, quantitative analysis, sampling, accuracy, precision, systematic and
random error, trace and ultra trace analyses, mean, absolute error, relative
error, sample standard deviation, standard deviation of the mean, variance.
confidence level, outliers, signal, noise, signal-to-noise ratio, calibration
curves, sensitivity, detection limits, quantitation limits. Problems: 1.1, 1.4, 1.7, 1.11, 1.19,
1.30
Chapter 2 (2.1
2.7) Introduction to Spectroscopy
Electromagnetic
radiation, Interaction of radiation with matter, absorption, emission,
scattering, transmission, reflection, luminescence, fluorescence, phosphorescence,
ground state, excited state, electronic transitions, vibrational transitions,
rotational transitions, Beer Lambert Law, absorbance, absorptivity,
transmittance, deviations from Beers
law, stray light, calibration curve method, standard addition method, internal
standard, spectrometer, continuum and line sources, filters, monochromators,
prisms, gratings, resolution, resolution of prisms and gratings, optical slits,
single-beam and double-beam optics, Fourier Transform spectrometers, interferometer.
Problems: 2.7, 2.8, 2.14, 2.15, 2.18, 2.25, 2.26, 2.27, 2.31,
2.34, 2.38, 2.41
Chapter 5 (5.1
5.3, 5.5, 5.8 5.10) Visible and Ultraviolet Molecular Spectroscopy
Electronic
transitions in molecules, absorption by molecules, molar absorptivity, shape of
absorption bands, solvents for UV-vis spectroscopy, UV-vis instrumentation, UV
and visible sources, UV-vis monochromators, UV-vis detectors, phototube,
photomultiplier tube, diode array detectors, sample holders for UV,
quantitative analysis in UV-vis, fluorescence and phosphorescence spectroscopy,
instrumentation for luminescence, arc lamps, applications of fluorescence. Problems:
5.1, 5.2, 5.3, 5.4, 5.6 ,5.10 ,5.12, 5.16, 5.17, 5.18, 5.19, 5.20, 5.42, 5.43
Chapter 4 (4.1
4.8) Infrared Spectroscopy
IR
absorption in molecules, dipole moment, stretching and bending vibrations,
windows for IR, IR sources, IR monochromators and interferometers, IR
detectors, sampling techniques for IR spectroscopy, IR reflectance and emission
measurements, attenuated total reflection, quantitative analysis with IR
spectroscopy, near IR spectroscopy, instrumentation for near IR, applications
of NIR Raman spectroscopy, Raman instrumentation, applications of Raman. Problems:
4.1, 4.2, 4.8, 4.11 ,4.12 ,4.15 ,4.16 ,4.19 ,4.21 ,4.22
Chapter 3 (3.1
3.6) Nuclear Magnetic Resonance Spectroscopy
magnetic
nuclei, nuclear spin, saturation, line widths, longitudinal and transverse
relaxation time, magic angle spinning, FTNMR, chemical shift, shielding,
spin-spin coupling, coupling constant, NMR instrumentation, magnet, probe, RF
generation and detection, sample preparation, molecular structural
determination in NMR, equivalent nuclei, chemical exchange, 1H NMR, 13C
NMR, 2D NMR, COSY, HETCOR, quantitative analysis in NMR. Problems: 3.1,
3.2, 3.3, 3.4, 3.5 , 3.8, 3.10, 3.15, 3.16, 3.19
TEST 1
Chapter 11 (11.1
11.12) Principles of Chromatography
Equilibrium
ratio, capacity factor, retention time, adjusted retention time, selectivity
factor, theoretical plate, resolution, HETP,
Van Deemter Equation, longitudinal diffusion, eddy diffusion, mass transfer, extra-column
band broadening, peak shape, normal and reverse phase chromatography, mass and
concentration detectors, Problems:
11.1, 11.2, 11.5, 11.7, 11.8, 11.9, 11.14
Chapter 12 (12.1
12.8) - Gas Chromatography
Carrier
gas, packed column, split-splitless injection, TCD detector, FID detector, ECD
detector, SP-FPD, NPD, GC-MS, GC-IR Problems: 12.1, 12.2, 12.6, 12.9
Chapter 13
(13.1 13.6) Chromatography with Liquid and
Column
efficiency in liquid chromatography.
Instrumentation, pumping systems, sample injection, detectors (UV,
fluorescence, refractive index, electrochemical). Partition chromatography, reverse-phase and
normal phase packings, selection of column and mobile phase. Adsorption
chromatography. Ion exchange chromatography. Size exclusion
chromatography. Thin layer
chromatography, Electrophoresis,
electro-osmotic flow, capillary zone electrophoresis (CZE), detectors,
capillary gel electrophoresis (CGE), micellar electrokinetic chromatography
(MEKC). Problems: 13.1, 13.6, 13.9, 13.11, 13.13, 13.20, 13.23
Chapter 9 - Mass
Spectroscopy I: Principles and Instrumentation
Sample
input systems, ionization sources (EI, CI, ESI, MALDI, FAB). Mass analyzers (magnetic sector,
double-focussing, quadrupole, time-of-flight, ion trap, FTICR), ion detectors
(electron multiplier, faraday cup), Problems: 9.1, 9.2, 9.3, 9.8, 9.10,
9.11, 9.12, 9.13, 9.14, 9.15, 9.16, 9.20
Chapter 10 - Mass
Spectroscopy II: Spectral Interpretation and Applications (10.1-10.4)
Base
peak, molecular ion, fragmentation, nitrogen rule, isotopic abundance,
heteroatoms, halogen isotopes, rings plus double bonds, mass spectra of common
classes of organic compounds, atomic MS, ICP-MS) Problems: 10.1, 10.2, 10.3, 10.15,
10.17, 10.21, 10.23, 10.29, 10.33
TEST 2
Chapter 6 -
Atomic Absorption Spectroscopy (6.1 6.5)
Atomic energy levels, atomic absorption,
atomic emission, atomic fluorescence, atomic line widths, effect of temperature
on atomic spectra, spectral linewidth, hollow cathode lamps, electrode-less
discharge lamp, flame atomization, electrothermal atomization, AA optics and
spectrometer, modulation, interferences in AAS, chemical interference, matrix
interference, ionization interference, spectral interference, background
correction, Problems: 6.1, 6.3, 6.5, 6.6, 6.17, 6.20, 6.28, 6.29, 6.30,
6.32
Chapter 7 Atomic
Emission Spectroscopy (7.1 - 7.3, 7.7, 7.9)
Flame
atomization, flame absorption profiles, types of flames, flame structure.
Electrothermal atomization, Atomic spectral sources, source modulation,
spectrophotometers, Spectral interferences, background correction. Chemical interferences, compound formation,
ionization. Sample preparation, solvent
effects, calibration curves, standard addition, detection limits, and
accuracy. Problems: 7.1, 7.2,
7.4, 7.7, 7.10, 7.11, 7.19, 7.24, 7.27
Chapter 8 -
Atomic X - Ray Spectroscopy (8.1 8.3)
Emission
of X-Rays, absorption of X-Rays, X-Ray fluorescence, X-Ray sources, X-Ray
Detectors and signal processors, wavelength dispersive instruments, energy
dispersive instruments, Problems: 8.2, 8.6, 8.9, 8.10
Chapter 14 -
Surface Analysis (14.1 14.2, 14.4 - 5)
Principles
of electron spectroscopy, ESCA, instrumentation for electron spectroscopy,
Auger electron spectroscopy, depth profiling, SIMS, electron microprobe Problems:
14.1, 14.4, 14.5, 14.7, 14.9, 14.12, 14.15, 14.18
Chapter 15 -
Electroanalytical Chemistry (15.1 15.4)
Some of
this material is covered in CHEM 321 and it is assumed that the student is
familiar with potentiometry and columetry methods. This material will be reviewed briefly in
class. Problems: 15.2, 15.4, 15.10, 15.11, 15.12, 15.13, 15.18
TEST 3
COMPREHENSIVE FINAL Wed. May 4, 2011 - 12:00 noon